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Electronics

Optoelectronics

News and Updates

Projects and Programs

Diagram showing our multidimensional spectroscopy experiment.

Femtosecond Nonlinear Optical Spectroscopy of Nanoscale Materials

Ongoing
The purpose of this project is to develop and refine spectroscopic techniques based on nonlinear optics for the study of novel materials. Measurements that isolate the nonlinear response are often better able to uncover physical processes that, in the linear response, are subtle and hard to isolate
Electron microscopy images

GaN Nanowire Growth

Ongoing
Selective epitaxy: We have demonstrated that the diameter and placement of nanowires can be controlled by using silicon nitride (SiNx) masks on top of MBE-grown buffer layers (see figure). With electron beam lithography, several patterns with 3 mm die size that provide over 100,000 controlled

Waveform Metrology Project

Ongoing
Optical measurement techniques: NIST uses the electro-optic sampling (EOS) technique to measure the vector response of photodiodes and provide phase traceability for commercial instrumentation, such as large-signal network analyzers, lightwave component analyzers, vector signal analyzers
x-ray laser welding setup

High-Power Laser Applications

Ongoing
Measurement challenges Traditional measurements of laser power or energy involve absorbing the laser light and measuring the resulting temperature increase of the absorber. However, as the power and total energy delivered by these lasers increases, thermal management, absorber size, and response

Publications

Electro-Optic Imaging Millimeter-Wave Propagation On-Wafer

Author(s)
Bryan Bosworth, Nick Jungwirth, Jerome Cheron, Franklyn Quinlan, Nate Orloff, Chris Long, Ari Feldman
We demonstrate an electro-optic imaging system for mmWaves propagating along a coplanar waveguide. Using dual optical frequency combs and a polarization

Studies of spatial uniformity and jitter in SiC UV SPADs

Author(s)
Joshua Bienfang, Edwin J. Heilweil, Anand Sampath, Gregory Garrett, Jonathan Shuster, Jeremy Smith, Michael Derenge, Daniel Habersat, Reza Gandhi, Sergei Dolinsky, Enrico Bellotti, michael wrabeck
Ultraviolet single-photon avalanche detectors (UV-SPAD) that are low cost, size, weight, and power as well as resilient to shock, high temperatures and stray

Software

On-Wafer Calibration Software

NIST Microwave Uncertainty Framework (Beta version) The NIST Microwave Uncertainty Framework provides a "drag-and-drop" toolkit for managing the calculation of

Tools and Instruments

Awards