Williams, D.
and Hartmut, U.
(1999),
Accurate Experimental Characterization of On-Chip Interconnects, 1999 URSI General Assembly, Toronto, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=920443
(Accessed January 2, 2025)
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Accurate Experimental Characterization of On-Chip Interconnects
Published
Author(s)
, Uwe A. Hartmut Grabinski
Abstract
In this paper we examine different approaches to the extraction of frequency dependent line parameters from broadband S-parameter measurements.Proceedings Title
1999 URSI General Assembly
Conference Dates
August 13-21, 1999
Conference Location
Toronto
Pub Type
Conferences
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Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created August 13, 1999, Updated February 19, 2017