Daniel Pierce is a NIST Fellow Emeritus in the Alternative Computing Group in the Nanoscale Device Characterization Division of the Physical Measurement Laboratory (PML). He received a B.S. in Physics from Stanford University, a M.A. in Physics from Wesleyan University (CT), and a Ph.D. in Applied Physics from Stanford University, where he was also a Postdoctoral Research Associate for one year. Following three years at the Swiss Federal Institute of Technology, he joined the research staff at NIST (then NBS) in 1975. Dan's research has been in the area of surface physics, with special emphasis on the development of spin-based measurements and their application to surface and thin film magnetism, such as imaging magnetization in magnetic nanostructures and measuring the interlayer coupling of magnetic multilayers. His work led to two "R&D 100" awards, the E. U. Condon and William P. Schlichter awards from NIST, Silver and Gold Medals from the Department of Commerce, the Gaede-Langmuir Prize from the American Vacuum Society (AVS), and the 2015 APS Joseph F. Keithley Award for Advances in Measurement Science. Dan has three patents and over 180 publications, and is a Fellow of the American Physical Society and the AVS. He is currently working on applying Scanning Electron Microscopy with Polarization Analysis (SEMPA) to new materials and devices in the CNST nanomagnetics program.