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Erik M. Secula (Fed)
Deputy Division Chief
Mr. Secula is the Deputy Chief of the Nanoscale Device Characterization Division of the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST). Since joining NIST in 1998, Mr. Secula has provided technical information to the semiconductor industry through the marketing of the Division's programs and the management of the technology transfer processes within the Division. Mr. Secula supervises most of the Division’s administrative staff, serves as the Division Safety Representative, develops web pages, develops and maintains databases, serves as an Editorial Review Board Sponsor, assists with strategic planning, and serves on the committee and as the publications coordinator for the Frontiers of Characterization and Metrology for Nanoelectronics conference series.
