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Electronic engineers, materials scientists, designers and others engaged in the development and manufacture of microelectronic products are invited to submit papers for the 6th International Workshop on Moisture in Microelectronics, Oct. 15-17, 1996. The workshop will be held at the Commerce Department's National Institute of Standards and Technology, Gaithersburg, Md. It is being co-sponsored by NIST and the U.S. Air Force Rome Laboratory, Rome, N.Y.
The workshop will provide leaders from industry, universities and government with a forum for the exchange of information and ideas on problems and solutions to moisture measurement and control in microelectronics packaging and interconnection. Advancements in the current state of moisture measurement, modeling, and their impact on the performance and reliability of materials, devices and assemblies will be documented at the workshop.
According to workshop organizers, the intrusion of moisture into microelectronic products is a major problem in the manufacture, performance and reliability of electronic devices. The goal of the workshop is to help U.S. industry respond to the challenges and concerns associated with moisture in the manufacture and use of semiconductor packages and electronic interconnects.
Papers are requested on the following topics: moisture effects on polymer packaging and substrate materials; moisture-related device and board-level performance, failure and reliability; impact of moisture on semiconductor manufacturing; impact of moisture on board-level manufacture and assembly; statistical process control and moisture; moisture measurement techniques; modeling of moisture effects; hermeticity; moisture concerns in modern hermetic and non-hermetic packaging schemes; and military and aerospace moisture requirements. Papers on other relevant topics also are being solicited.
Prospective authors are requested to submit a 100 to 150 word abstract by March 1, 1996. The abstract must include the author(s) name, mailing address, telephone and fax number, and an e-mail address if available. A notice of acceptance will be mailed by June 1, 1996. Authors of accepted papers will be required to submit their final paper by Oct. 1, 1996. The proceedings will be published after the workshop.
For information, or to submit an abstract or paper, contact Michael A. Schen, B320 Polymer Bldg., NIST, Gaithersburg, Md. 20899-0001, (301) 975-6741, fax: (301) 869-3239, e-mail: michael.schen [at] nist.gov (michael[dot]schen[at]nist[dot]gov), or contact Benjamin A. Moore, Rome Laboratory, 525 Brooks Road, Rome, N.Y. 13441-4505, (315) 330-3450, fax: (315) 330-2247 or 2153, e-mail: mooreb [at] rl.af.mil (mooreb[at]rl[dot]af[dot]mil).
The U.S. Air Force Rome Laboratory works to advance the science and technology of command, control, communications, computers and intelligence and to transition them into systems to meet customer needs.
As a non-regulatory agency of the Commerce Department's Technology Administration, NIST promotes U.S. economic growth by working with industry to develop and apply technology, measurements and standards.