Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Nanoscale deformation in polymers revealed by single-molecule super-resolution localization-orientation microscopy

Published

Author(s)

Muzhou Wang, James M. Marr, Marcelo I. Davanco, Jeffrey W. Gilman, James Alexander Liddle

Abstract

Single-molecule super-resolution microscopy has attracted interest in materials science because of its ability to non-invasively explore nanostructures in real-space, but it also introduces a new set of challenges, including the need to image dense periodic structures, and an increased dependence of localization accuracy and resolution on fluorophore orientation. In this study, we optically image nanolithographically patterned polymer films in order to demonstrate the capabilities of this technique on model structures that are more representative of typical situations in materials science. Using simple labeling procedures and standard optical configurations, we can clearly resolve periodic features of 20 nm half-pitch, and individual features 25 nm  25 nm. Electron microscopy provides a ground truth for direct comparison with the optical images, enabling direct measurement of fluorophore localization error that includes both precision and accuracy. We use this error to derive a general expression for resolution based on a simple statistical argument. Finally, we also determine fluorophore orientation simultaneously with position by comparing their point-spread functions to vectorial diffraction calculations. Although orientation has been identified as a source of localization error, we demonstrate that it can also report changes to the nanoscale environment in films patterned by nanoimprint lithography. By combining super-resolution imaging with orientation for the first time, we can directly detect areas of local nanoscale deformation.
Citation
Materials Horizons
Volume
6
Issue
4

Citation

Wang, M. , Marr, J. , Davanco, M. , Gilman, J. and Liddle, J. (2019), Nanoscale deformation in polymers revealed by single-molecule super-resolution localization-orientation microscopy, Materials Horizons, [online], https://doi.org/10.1039/C8MH01187G, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=923931 (Accessed November 21, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 29, 2019, Updated October 12, 2021