Open for Public Comment: Draft NIST SP 1800-36, Vols. B–E, Trusted Internet of Things (IoT) Device Network-Layer Onboarding and Lifecycle Management

The National Cybersecurity Center of Excellence (NCCoE) has published Draft NIST SP 1800-36, Vols. B –E, Trusted Internet of Things (IoT) Device Network-Layer Onboarding and Lifecycle Management. The comment period is open now through June 20, 2023. 

About the Project

Provisioning network credentials to IoT devices in an untrusted manner leaves networks vulnerable to having unauthorized IoT devices connect to them. It also leaves IoT devices vulnerable to being taken over by unauthorized networks. Instead, trusted, scalable, and automatic mechanisms are needed to safely manage IoT devices throughout their lifecycles, beginning with secure ways to provision devices with their network credentials—a process known as trusted network-layer onboarding. Trusted network-layer onboarding, in combination with additional device security capabilities such as device attestation, application-layer onboarding, secure lifecycle management, and device intent enforcement could improve the security of networks and IoT devices.

This practice guide aims to demonstrate how organizations can protect both their IoT devices and their networks. The NCCoE is collaborating with product and service providers to produce example implementations of trusted network-layer onboarding and capabilities that improve device and network security throughout the IoT-device lifecycle to achieve this.

Submit Your Comments

The public comment period is open now through June 20, 2023. View the publication details for draft copies and instructions for submitting comments.

Contribute

If you have expertise in IoT and/or network security and would like to help shape this project, consider joining the IoT Onboarding Community of Interest. Contact the project team at iot-onboarding [at] nist.gov (iot-onboarding[at]nist[dot]gov) declaring your interest.