Albers, J.
(1984),
TXYZ a program for semiconductor IC thermal analysis:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.SP.400-76
(Accessed March 14, 2025)
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TXYZ a program for semiconductor IC thermal analysis:
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- NBS SP 400-76
Report Number
NBS SP 400-76
Pub Type
NIST Pubs
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Created January 1, 1984, Updated May 19, 2023