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World Intellectual Property Day

 April 26, 2025

 

The march of progress in today’s world is fueled by intellectual property. New discoveries, inventions, and technologies are enabled by the legal protections residing in patents, copyrights, trademarks, and other forms of intellectual property. Technology transfer facilitates the introduction of new technologies developed by federal research into the marketplace, where these technologies improve the quality of everyday life, benefit society, and strengthen the American economy.

The World Intellectual Property Organization, a United Nations agency created to promote the protection of intellectual property globally, designated April 26th as World Intellectual Property Day. Activities, publications, and contests promoted IP education and the appreciation of IP’s crucial and central role in our world. 

NIST’s passionate commitment to the importance of intellectual property and technology transfer is demonstrated by the NIST patents issued since last World Intellectual Property Day, covering an impressive range of scientific fields. Details of these patents can be found in the table below.

Patents Issued

InventorsPatent #TitleLaboratory
Aksyuk, Vladimir Anatolyevich; Artusio-Glimpse, Alexandra Brea; Holloway, Christopher Lee; Simons, Matthew Thomas12,188,969PHOTONIC RYDBERG ATOM RADIO FREQUENCY SENSOR ARRAY
 
Communications Technology Laboratory
Giorgetta, Fabrizio; Baumann, Esther; Newbury, Nathan Reynolds; Deschenes, Jean-Daniel; Coddington, Ian Robert12,276,548DUAL-COMB PLATFORM WITH DETERMINISTIC STEPPING AND SCANNING OF THE TEMPORAL PULSE OFFSETCommunications Technology Laboratory
Vogl, Gregory William; Tam, Wai Cheong; Brown, Christopher Uriah12,247,861REAL-TIME WIRELESS FLOW METER FOR A FIRE HOSE
 
Engineering Laboratory
Tabrizi, Seyed Alireza Seif; Liu, Yi-Kai; Hafezi, Mohammad12,014,247COMPRESSED SENSING MEASUREMENT OF LONG-RANGE CORRELATED NOISE
 
Information Technology Laboratory
Simon Jr., Carl G.; Schaub, Nicholas; Bharti, Kapil; Hotaling, Nathan2019236297USING MACHINE LEARNING AND/OR NEURAL NETWORKS TO VALIDATE STEM CELLS AND THEIR DERIVATIVES (2-D CELLS IN CULTURE AND 3-D TISSUES) FOR USE IN CELL THERAPY AND TISSUE ENGINEERED PRODUCTSMaterial Measurement Laboratory
Simon Jr., Carl G.; Schaub, Nicholas; Bharti, Kapil; Hotaling, Nathan12,080,494USING MACHINE LEARNING AND/OR NEURAL NETWORKS TO VALIDATE STEM CELLS AND THEIR DERIVATIVES (2-D CELLS IN CULTURE AND 3-D TISSUES) FOR USE IN CELL THERAPY AND TISSUE ENGINEERED PRODUCTSMaterial Measurement Laboratory
Kelman, Zvi; Marino, John Paul; Tullman, Jennifer Anne12,275,760ClpS BINDING REAGENT FOR PROTEIN SEQUENCINGMaterial Measurement Laboratory
Tomlin, Nathan Andrew; Yung, Christopher Shing-Yu12,209,912PHOTONIC BOLOMETER ARRAY READOUT USING NEGATIVE PHOTOTHERMAL FEEDBACK
 
Physical Measurement Laboratory
Klimov, Nikolai Nikolaevich; Lipe, Thomas Eller; Cular, Stefan; Hagmann, Joseph A.12,066,741PHOTONIC AC-DC VOLTAGE CONVERTER
 
Physical Measurement Laboratory
Gaitan, Michael; Geist, Jon; Reschovsky, Benjamin James; Chijioke, Akobuije Douglas Eziani12,222,239CALIBRATION OF LASER DOPPLER VIBROMETERS USING ACOUSTOOPTIC MODULATORSPhysical Measurement Laboratory
Kearsley, Anthony Jose; Cooksey, Gregory Alan; Patrone, Paul Nathan12,072,277MULTIPLEXED AMPLITUDE MODULATION FLUOROMETRY
 
Physical Measurement Laboratory
Balijepalli, Arvind Kumar; Majikes, Jacob Michael12,195,787DNA NANOTECHNOLOGY-BASED BIOMARKER MEASUREMENT PLATFORM
 
Physical Measurement Laboratory
Reyes-Hernandez, Darwin René; Nablo, Brian; Lee, JongMuk12,158,410REAL-TIME QUANTIFICATION OF SUPRAVITAL DYE UPTAKE BY CELLS WITH A LENS-FREE IMAGING SYSTEM UTILIZING TWO LIGHT SOURCES
 
Physical Measurement Laboratory
Vissers, Michael; Gao, Jiansong; Wheeler, Jordan; Malnou, Maxime Bernard Jacques12,123,786CRYOGENIC THERMOMETER BASED ON TWO-LEVEL SYSTEMS
 
Physical Measurement Laboratory
Taylor, Jacob Mason; Richman, Brittany Rachel12,176,593SUPERCONDUCTING VORTEX-BASED MICROWAVE CIRCULATOR
 
Physical Measurement Laboratory
Obeng, Yaw Samuel12,276,607RAPID AND LABEL-FREE MONITORING OF ULTRAVIOLET RADIATION BIOREMEDIATION WITH BROADBAND DIELECTRIC SPECTROSCOPY
 
Physical Measurement Laboratory
Gorman, Jason John; LeBrun, Thomas Warren ; Long, David Alexander12,092,652MICROFABRICATED OPTOMECHANICAL ACCELEROMETER WITH HEMISPHERICAL AND SPHERICAL OPTICAL CAVITIES
 
Physical Measurement Laboratory
Kaufman, Adam M.; Bienias, Przemyslaw Dariusz; Belyansky, Ron; GORSHKOV, Alexey Vyacheslavovich; Young, Jeremy12,026,586MULTI-QUBIT GATES VIA DIPOLE-DIPOLE INTERACTIONS
 
Physical Measurement Laboratory
Tew Jr., Weston Leo; Woods, Solomon Isaac; Bui, Thinh Quoc12,188,900FREQUENCY-AGILE MAGNETIC MEASUREMENT SYSTEM WITH TEMPERATURE CONTROL
 
Physical Measurement Laboratory
Vaskuri, Anna Katariina; Rahn, Daniel; Williams, Paul A.12,169,141GRAVITY-ENFORCED PHOTON MOMENTUM RADIOMETER
 
Physical Measurement Laboratory
Bertness, Kristine A.; Brubaker, Matthew David; Fay, Patrick12,009,418GALLIUM NITRIDE CORE-SHELL FIN FIELD EFFECT TRANSISTOR FABRICATED BY SELECTIVE EPITAXY
 
Physical Measurement Laboratory
Lu, Xiyuan; Srinivasan, Kartik Arvind12,259,635HYBRID-MODE-FAMILY OPTICAL PARAMETRIC OSCILLATION FOR ROBUST COHERENT LIGHT GENERATION ON CHIPPhysical Measurement Laboratory
Stroud, Jasper Rose; Plusquellic, David Francis12,276,599INTERLEAVED DUAL-CHIRPED COMB SYSTEM FOR MAGNIFICATION OF TEMPORAL DYNAMICSPhysical Measurement Laboratory
Schlamminger, Stephan; Chao, Leon Shih12,276,559ELECTRONIC NIST TORQUE REALIZER (ENTR)Physical Measurement Laboratory
Wang, Yicheng; Schlamminger, Stephan; Waltrip, Bryan12,235,303A DOUBLE-BALANCE LCR METERPhysical Measurement Laboratory

More Information on World Intellectual Property Day can be found at the World Intellectual Property Organization.

Created April 2, 2024, Updated April 24, 2025