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"Overview of Recent Atomic Spectroscopy at the NIST Electron Beam Ion Trap (EBIT) Facility"
J. D. Gillaspy,
AIP Conf. Proc. 1438, 97 (2012)
"Magnetic-Dipole Transitions in Tungsten and Other Heavy Elements Observed with the NIST EBIT"
J. Reader, J. D. Gillaspy, D. Osin, and Yu. Ralchenko,
AIP Conf. Proc. 1438, 86 (2012)
"Laboratory Astrophysics Results from the NIST-SAO EBIT Team",
J. D. Gillaspy and E. Silver,
Proceedings of the 2010 NASA Laboratory Astrophysics Workshop, p. C-9 (2011)
"Work Towards Experimental Evidence of Hard X-ray Photoionization of Highly Charged Krypton",
E. Silver, J. D. Gillaspy, P. Gokhale, E. P. Kanter, N. S. Brickhouse, R. W. Dunford, K. Kirby, T. Lin, J. McDonald, D. Schneider, S. Seifert, and L. Young, AIP Conference Proceeding 1336, 146 (2011)
"X-Ray Spectroscopy of Highly Charged Ions in Laboratory and Astrophysical Plasmas,"
E.H. Silver, N.S. Brickhouse, T. Lin, G.X. Chen, K. Kirby, J.D. Gillaspy, J.N. Tan, and J.M. Laming, in Recent Advances in Spectroscopy: Theoretical, Astrophysical and Experimental Perspectives, edited by R.K. Chaudhuri et al. (Springer, Berlin, 2010), p. 1-10 (2010)
"Magnetoresistance based first-order reversal curve analysis of magnetic tunnel junctions,"
J.M. Pomeroy, T.C. White, H. Grube, J.C. Read, and J.E. Davies
Appl. Phys. Lett. 95, 022514 (2009)
"Negative resistance" errors in four-point measurements of tunnel junctions and other crossed-wire devices,"
J.M. Pomeroy and H. Grube,
J. Appl. Phys. 105, 094503 (2009)
"Highly Charged Ion (HCI) Modified Tunnel Junctions,"
J.M. Pomeroy and H. Grube,
AIP Conference Proceeding Series 1099, 520 (2009). Preprint at APCPCS/1099/520/1.
"Spatial and electronic characterization of nano-features created by highly charged ions,"
J. M. Pomeroy, H. Grube, and A. C. Perrella,
Radiation Effects & Defects in Solids, 162, 473 (2007)
"Highly Charged Ion Modified Magnetic Tunnel Junctions,"
H. Grube, J.M. Pomeroy, A.C. Perrella, and J.D. Gillaspy,
in Self Assembly of Nanostructures Aided by Ion- or Photon-Beam Irradiation--Fundamentals and Applications, ed. by R. Kalyanaraman, U. Valbusa, and Z. Zhang (Mater. Res. Soc. Symp. Proc. 960E, Warrendale, PA, 2007), 0960-N08-02.
"Radiation from K-shell filling in highly-charged ions: a driver for resonant combination cancer therapy?"
A.P. Kavanagh, J.D. Gillaspy, D.G. Hirst M.H. Mendenhall, N. Nakamura, S. Ohtani, H. Watanabe, and F.J. Currell,
J. Phys. Conf. Ser. 58, 439-442 (2007)
"The Potential of Highly Charged Ions: Possible Future Applications,"
J.D. Gillaspy, J.M. Pomeroy, A.C. Perrella, and H. Grube,
J. Phys. Conf. Ser. 58, 451-456 (2007)
"Potential Energy Sputtering of EUVL Materials,"
Chapter 38 in EUV Sources for Lithography,
J.M. Pomeroy, L.P. Ratliff, J.D. Gillaspy, and S. Bajt, ed. by V. Bakshi (SPIE Press, 2006), p. 1033-1044.
"Atomic Xenon Data,"
Chapter 3 in EUV Sources for Lithography,
J.D. Gillaspy, ed. by V. Bakshi (SPIE Press, 2006), p. 47-112
"EUV Spectroscopy of Xenon Ions Created Using an Electron Beam Ion Trap,"
K. Fahy, E. Sokell, G. O'Sullivan, A. Cummings, A. Aguilar, J.D. Gillaspy, J.M. Pomeroy, and J.N. Tan,
in Opto-Ireland 2005: Optical Sensing and Spectroscopy, Proc. SPIE 5826, ed. by H.J. Byrne, et al. (SPIE, Bellingham, WA, 2005) p. 351-362. (color preprint 302 kB PDF).
"An Electron Beam Ion Trap (EBIT) plus a microcalorimeter: a good combination for laboratory astrophysics,"
J.N. Tan, E. Silver, J. Pomeroy, J.M. Laming, and J. Gillaspy,
Phys. Scr. T119, 30 (2005) (Preprint 1.1 MB PDF).
Highly Charged Atoms: Publications of the EBIT Project, 1993-2001,
J.D. Gillaspy, L.P. Ratliff, J.R. Roberts, and E. Takacs, Eds., NIST SP-972 (25 MB PDF, black-and-white version) (Nat'l. Inst. Stand. Tech., Gaithersburg, MD, 2002), pp. 304. john.gillaspy [at] nist.gov (Subject: NIST%20Blue%20Book%20request) (Request bound hardcopy (color) and CD of SP 972).
"UTA versus line emissions for EUVL: Studies on xenon emission at the NIST EBIT,"
K. Fahy, P. Dunne, L. McKinney, G. O'Sullivan, E. Sokell, J. White, A. Aguilar, J.M. Pomeroy, J.N. Tan, B. Blagojevic, E.-O. LeBigot, and J.D. Gillaspy,
J. Phys. D: Appl. Phys. 37, 3225-3232 (2004) (download free color preprint: http://arxiv.org/abs/physics/0507046).
"Visible, EUV, and X-ray Spectroscopy at the NIST EBIT Facility" (1.5 MB PDF),
J.D. Gillaspy, B. Blagojevic, A. Dalgarno, K. Fahey, V. Kharchenko, J.M. Laming, E.-O. LeBigot, L. Lugosi, L.P. Ratliff, H.W. Schnopper, E.H. Silver, E. Takacs, J.N. Tan, H. Tawara, and K. Tokesi,
in Atomic Processes in Plasmas, ed. by J.S. Cohen, S. Mazevet, and D.P. Kilcrease (AIP, New York, 2004), p. 245.
"Astrophysics and spectroscopy with microcalorimeters on an EBIT,"
E. Takacs, E. Silver, J.M. Laming, J.D. Gillaspy, H. Schnopper, N. Brickhouse, M. Barbera, L.P. Ratliff, H. Tawara, K. Makonyi, N. Madden, D. Landis, J. Beeman, and E.E. Haller,
Nucl. Instrum. Meth. B 205, 144 (2003)
"Highly Charged Ion Bombardment of Silicon Surfaces,"
J.E. Sanabia, S.N. Goldie, L.P. Ratliff, L.S. Goldner, and J.D. Gillaspy,
AIP Conference Proc. 680, 568 (2003)
"Broadband high resolution spectroscopy of highly charged ions with a microcalorimeter on an electron beam ion trap" (356 kB PDF),
E. Silver, H. Schnopper, S. Bandler, N. Brickhouse, S. Murray, M. Barbera, E. Takacs, J.D. Gillaspy, J.V. Porto, I. Kink, L.P. Ratliff, L.T. Hudson, J.M. Laming, N. Madden, D. Landis, J. Beeman, E.E. Haller, and R. Schuch, Photonic, Electronic, and Atomic Collisions (XXII ICPEAC), edited by S. Datz, M.E. Bannister, H.F. Krause, L.H. Saddig, D. Schultz, and C.R. Vane (Rinton Press, Melville, 2002) p. 312.
"Absolute test of quantum electrodynamics for helium-like vanadium,"
D. Paterson, C.T. Chantler, L.T. Hudson, F.G. Serpa, J.D. Gillaspy, and E. Takacs,
in The Hydrogen Atom: Precision Physics of Simple Atomic Systems, ed. by S.G. Karshenboim, F.S. Pavone, G.F. Bassani, M. Inguscio, and T.W. Hansch (Springer-Verlag, Berlin, 2000), pp. 699-713.
"EBIT diagnostics using x-ray spectra of highly ionized Ne,"
M. Matranga, M. Barbera, A. Maggio, G. Peres, S. Serio, E. Takacs, E. Silver, J. Gillaspy, H. Schnopper, M. Laming, J. Beeman, E. Haller, N. Madden,
Nucl. Instrum. Meth. Phys. Res. B 205, 244-249 (2003)
"Trapped Highly Charged Ion Plasmas,"
E. Takacs and J. D. Gillaspy,
Non-Neutral Plasma Physics IV, AIP, CP606, 0-7354-0050-4. (2002)
"Highly Charged Ion Studies at the NIST EBIT," in Trapping Highly Charged Ions: Fundamentals and Applications, L.P. Ratliff, J.R. Roberts,
ed. by J.D. Gillaspy, Nova Science Publishers (2001), p. 257.
"In situ imaging of highly charged ion irradiated mica,"
L.P. Ratliff and J.D. Gillaspy,
16th Int'l. Conf. on the Application of Accelerators in Research and Industry, AIP Conf. Proc. 576 (2001)
"Forbidden Line Wavelengths and Transition Probabilities Measured Using an Electron Beam Ion Trap (EBIT),"
E. Traebert, P. Beiersdorfer, S.B. Utter, J.D. Gillaspy, and F.G. Serpa,
Proc. 6th Int'l Colloquium on Atomic Spectra and Oscillator Strengths for Astrophysical and Laboratory Plasmas, University of Victoria Press, British Columbia (1998)
"Large scale molecular dynamics simulation of a surface Coulomb explosion,"
H.-P. Cheng and J.D. Gillaspy,
AIP Conf. Proc. 392, Application of Accelerators in Research and Industry, ed. by J.L. Duggan and I.L. Morgan (AIP Press, Woodbury, New York, 1997), p. 197.
"Overview of the Electron Beam Ion Trap Program at NIST,"
J.D. Gillaspy, Y. Aglitskiy, E.W. Bell, C.M. Brown, C.T. Chantler, R.D. Deslattes, U. Feldman, L.T. Hudson, J.M. Laming, E.S. Meyer, C.A. Morgan, A.I. Pikin, J.R. Roberts, L.P. Ratliff, F.G. Serpa, J. Sugar, and E. Takacs,
Proc. Nobel Symposium 91, Phys. Scr. T59, 392 (1995)
"Update on the NIST EBIT,"
J.D. Gillaspy, J.R. Roberts, C.M., Brown, and U. Feldman,
National Institute of Standards and Technology Special Publication 850, Apr. 1993 (U.S. Government Printing Office, Washington, 1993).
"The NIST EBIT; A Progress Report," VIth Int'l Conf. on the Physics of Highly Charged Ions,
J.D. Gillaspy, J.R. Roberts, C.M., Brown, and U. Feldman,
AIP Conf. Proc. 274 ed. by P. Richard, M. Stockli, and C.D. Lin, (AIP press, New York, 1993), p. 682.