Dominguez, I.
, Kuhn, D.
, Kacker, R.
and Lei, Y.
(2013),
CCM: A Tool for Measuring Combinatorial Coverage of System State Space, ACM / IEEE International Symposium on Empirical Software Engineering and Measurement , Baltimore, MD, US, [online], https://doi.org/10.1109/ESEM.2013.44
(Accessed December 26, 2024)
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CCM: A Tool for Measuring Combinatorial Coverage of System State Space
Published
Author(s)
Itzel Dominguez, , , Yu Lei
Abstract
This poster presents some measures of combinatorial coverage that can be helpful in estimating residual risk related to insufficient testing of rare interactions, and a tool for computing these measures.Conference Dates
October 10-11, 2013
Conference Location
Baltimore, MD, US
Conference Title
ACM / IEEE International Symposium on Empirical Software Engineering and Measurement
Pub Type
Conferences
Download Paper
Keywords
combinatorial testing, factor covering array, state-space coverage, t-way testing, t-way testing
Citation
Issues
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Created October 9, 2013, Updated October 12, 2021