Zong, Y.
(2010),
Analysis of Uncertainties in Stray-Light Correction, CIE Expert Symposium on Spectral and Imaging Methods for Photometry and Radiometry, Bern, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=906999
(Accessed December 22, 2024)
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Analysis of Uncertainties in Stray-Light Correction
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Author(s)
Abstract
Measurement errors arising from stray light within a spectroradiometer are often the dominant source of uncertainty and are difficult to reduce. However, the stray-light errors can be corrected by using a stray-light correction matrix that is derived from a set of spectral line spread functions of a spectroradiometer. The correction reduces the magnitude of stray-light errors by one to two orders; thus a well characterized, stray-light corrected spectroradiometer can achieve measurement uncertainties that are comparable to those of conventional high-end instruments. This paper identifies the sources of uncertainty in stray-light correction and analyzes the overall uncertainty after a correction. The uncertainties of a stray-light correction are mainly caused by errors in the measured SLSFs that depend strongly on the quality of a spectroradiometer and the quality of spectral line sources used for the characterization of stray light. An example is given for measurement of four light-emitting diodes (LEDs) for CIE chromaticity by using both a stray-light corrected array spectroradiometer and a conventional double-monochromator type spectroradiometer. The agreements between the measurement results are well within the measurement uncertainties of each instrument.Proceedings Title
CIE Expert Symposium on Spectral and Imaging Methods for Photometry and Radiometry
Volume
CIE x036:2010
Conference Dates
August 30-31, 2010
Conference Location
Bern
Conference Title
CIE Tutorial and Expert Symposium on Spectral and Imaging Methods for Photometry and Radiometry
Pub Type
Conferences
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Keywords
spectroradiometer, stray light, uncertainty
Citation
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Created December 1, 2010, Updated February 19, 2017