Gates, R.
and Reitsma, M.
(2009),
Prototype Cantilevers for AFM Calibration and Nanomechanical Property Measurement, Cornell Nanoscale Facility Research Accomplishments, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=902689
(Accessed December 26, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Prototype Cantilevers for AFM Calibration and Nanomechanical Property Measurement
Published
Author(s)
,
Abstract
Atomic Force Microscopy (AFM) is a widely used technique for imaging surfaces and measuring properties at the micro and nano-scales; however, the accuracy and precision of these measurements is hampered by the lack of suitable traceable standards and precision measurement methods. The purpose of this project is to explore potential cantilever designs as calibration reference artifacts and probes for making precise nanomechanical property measurements.Citation
Cornell Nanoscale Facility Research Accomplishments
Pub Type
Others
Download Paper
Keywords
AFM, Calibration, Cantilever, Nanomechanical Property, Spring Constant
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created June 11, 2009, Updated February 19, 2017