DeSalvo, J.
, Hati, A.
, Nelson, C.
and Howe, D.
(2012),
Phase-Noise Measurement of a 670 GHz Source, Proceedings of the 2012 IEEE International Frequency Control Symposium, Baltimore, MD
(Accessed June 30, 2024)
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Phase-Noise Measurement of a 670 GHz Source
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Author(s)
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Abstract
We present phase-noise measurements in support of terahertz electronics. Using digital phase-noise measurement techniques and an even-harmonic mixer, we achieve a phase-noise measurement system in waveguide (WR1.5). At 670 GHz an upper bound of this system's noise floor is found to be -20, -40, and -60 dBc/Hz at 1, 100, and 10000 Hz offsets, respectively. In addition, a commercial, low-phase-noise, 670 GHz source is measured at offset frequencies from 0.1 Hz to 1 MHz.Proceedings Title
Proceedings of the 2012 IEEE International Frequency Control Symposium
Conference Dates
May 22-24, 2012
Conference Location
Baltimore, MD
Conference Title
2012 IEEE International Frequency Control Symposium
Pub Type
Conferences
Keywords
frequency control, harmonic mixers, metrology, phase noise, ubmillimeter wave measurements
Citation
Issues
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Created May 24, 2012, Updated February 19, 2017