SRM 1450d, Fibrous-Glass Board, for Thermal Conductivity from 280 K to 340 K

Published

August 1, 2011

Author(s)

Robert R. Zarr, Amanda C. Harris, John F. Roller, Stefan D. Leigh

Abstract

Thermal conductivity measurements at and near room temperature are presented as the basis for certified values of thermal conductivity for SRM 1450d, Fibrous Glass Board. The measurements have been conducted in accordance with a randomized full factorial experimental design with two variables, bulk density and temperature, using the NIST 1016 mm line-heat-source guarded-hot-plate apparatus. The thermal conductivity of the SRM specimens was measured over a range of bulk densities from 114 kg∙m^-3 to 124 kg∙m^-3 and mean temperatures from 280 K to 340 K. Uncertainties of the measurements, consistent in format with current international guidelines, have been prepared. Statistical analyses of the physical properties from the SRM are presented and include variations between boards, as well as within board. Each unit of SRM 1450d is individually certified for bulk density, ρ, and batch certified for thermal conductivity with the following equation: λ=(1.10489x10^-4)xT_m where λ is the predicted thermal conductivity (W∙m^-1∙K^-1) and T_m is the mean temperature (K) valid over the temperature range of 280 K to 340 K. The expanded uncertainty for λ values from the above equation is 1% with a coverage factor of approximately k = 2.

Citation

Special Publication (NIST SP) - 260-173

Report Number

260-173

NIST Pub Series

Special Publication (NIST SP)

Pub Type

NIST Pubs

Download Paper

DOI Link

Keywords

calibration, bulk density, fibrous glass board, guarded hot plate, heat flow meter, standard reference material, SRM 1450, thermal conductivity, thermal insulation, uncertainty

Citation

Zarr, R. , Harris, A. , Roller, J. and Leigh, S. (2011), SRM 1450d, Fibrous-Glass Board, for Thermal Conductivity from 280 K to 340 K, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.SP.260-173 (Accessed December 21, 2024)