Structural analysis of multilayer graphene via atomic moiré interferometry

Published

March 24, 2010

Author(s)

David L. Miller, Kevin Kubista, Gregory M. Rutter, Ming Ruan, Walt A. de Heer, Phillip First, Joseph A. Stroscio

Abstract

The rotation of stacked honeycomb lattices produces an observable moir e pattern in the topography of scanning tunneling microscopy images, which have long been observed in highly-oriented pyrolytic graphite due to rotation of the surface layer relative to layers below. Here, we observe the combined e ect of three-layer moir e patterns in graphene grown on SiC(000 1). Small angle rotations between the first and third layer are shown to produce a double-moir e pattern, resulting from the beat frequencies of interfering moir e patterns of the first three layers. Additionally, unconventional patterns are also observed due to relative lattice strain between the layers. We model the moir e patterns as a beating of the mismatched reciprocal lattice vectors and show how moir e patterns can be used to determine the relative strain between lattices.

Citation

Physical Review B

Volume

81

Pub Type

Journals

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Keywords

graphene, silicon carbide, scanning tunneling microscopy

Citation

Miller, D. , Kubista, K. , Rutter, G. , Ruan, M. , de Heer, W. , First, P. and Stroscio, J. (2010), Structural analysis of multilayer graphene via atomic moiré interferometry, Physical Review B, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=904601 (Accessed November 7, 2024)