U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Size Measurement of Nanoparticles using Atomic Force Microscopy

Published

Author(s)

Jaroslaw Grobelny, Frank W. DelRio, Pradeep Namboodiri, Doo-In Kim, Vincent A. Hackley, Robert F. Cook

Abstract

This chapter outlines procedures for sample preparation and the determination of nanoparticle size using atomic force microscopy (AFM). To start, procedures for dispersing gold nanoparticles on various surfaces such that they are suitable for imaging and height measurement via intermittent contact mode, or tapping mode, AFM are described. The methods for AFM calibration and operation to make such measurements are then discussed. Finally, the techniques for data analysis and reporting are provided. The example nanoparticles considered are National Institute of Standards and Technology (NIST) Au nanoparticle Reference Materials RM 8011 (nominally 10 nm particles), RM 8012 (nominally 30 nm), and RM 8013 (nominally 60 nm).
Citation
Methods in Molecular Medicine, Characterization of Nanoparticles Intended for Clinical Applications
Publisher Info
Humana Press, Totowa, NJ
Pub Type
Books

Keywords

Nanoparticles, atomic force microscopy
Polymers and Nanomaterials

Citation

Grobelny, J. , DelRio, F. , Namboodiri, P. , Kim, D. , Hackley, V. and Cook, R. (2011), Size Measurement of Nanoparticles using Atomic Force Microscopy, Humana Press, Totowa, NJ (Accessed April 20, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 31, 2010, Updated October 12, 2021