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Monte Carlo Simulation of Noise Parameter Uncertainties
Published
Author(s)
James P. Randa, Wojciech Wiatr
Abstract
We present results for uncertainties in noise-parameter measurements, obtained using a Monte Carlo simulation of the measurements. Sets of data were generated to simulate measurements on a low-noise amplifier, with given uncertainties in the underlying measurements, including the standard noise temperature (hot or cold), the ambient temperature, the reflection coefficients of the terminations, the scattering parameters of the amplifier, the power measurements, and variations in the connections. Each set of simulated measurement results was analyzed to determine the "measured" noise parameters, and the standard deviation of the set of measured noise-parameter values was computed to determine the uncertainty in each noise parameter. Results are presented fro the noise parameter uncertainties for different values of the underlying measurement uncertainties.
Citation
IEE Proceedings-Science Measurement and Technology
Randa, J.
and Wiatr, W.
(2002),
Monte Carlo Simulation of Noise Parameter Uncertainties, IEE Proceedings-Science Measurement and Technology, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=12549
(Accessed January 15, 2025)