Marinenko, R.
and Leigh, S.
(2010),
Uncertainties in Electron Probe Microanalysis, European Microbeam Analysis Society 2009
, Gdansk, -1
(Accessed February 5, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Uncertainties in Electron Probe Microanalysis
Published
Author(s)
,
Abstract
This tutorial discusses the importance of citing valid uncertainties when reporting analytical results and the need for a universally accepted approach for evaluating uncertainties. Today, the CIPM procedure has been accepted by numerous international organizations, as well as accepted and used by NIST. The basics of the CIPM approach are described and it is applied to the equations used in wavelength dispersive electron probe microanalysis quantification with an experimental example.Proceedings Title
European Microbeam Analysis Society 2009
Volume
7
Issue
1
Conference Dates
May 10-14, 2009
Conference Location
Gdansk
Conference Title
11th European Workshop on Modern Developments and Applications in Microbeam Analysis
Pub Type
Conferences
Keywords
"CIPM approach", "electron probe microanalysis", "microanalysis", "standard uncertainty", "uncertainty"
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created March 12, 2010, Updated June 2, 2021