Integrating-Sphere System and Method for Absolute Measurement of Transmittance, Reflectance and Absorptance of Specular Samples

Published

July 1, 2001

Author(s)

Leonard M. Hanssen

Abstract

An integrating sphere system has been designed and constructed for multiple optical property measurement in the infrared spectral range. In particular, for specular samples, the absolute transmittance and reflectance can be measured directly with high accuracy and the absorptance obtained from these by simple calculation. These properties are measured with a Fourier transform spectrophotometer for several samples of both opaque and transmitting materials. The expanded uncertainties of the measurements are shown to be less than 0.003 (absolute) over most of the detector-limited working spectral range of 2 m to 18 m. The sphere is manipulated via two rotation stages which enable the ports on the sphere to be rearranged in any orientation relative to the input beam. Although the sphere system is used for infrared spectral measurements, the measurement method, design principles and features are generally applicable to other wavelengths as well.

Citation

Applied Optics

Volume

40

Issue

No. 19

Pub Type

Journals

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Keywords

absolute, infrared, integrating sphere, method, reflectance, regular, specular, transmittance

Citation

Hanssen, L. (2001), Integrating-Sphere System and Method for Absolute Measurement of Transmittance, Reflectance and Absorptance of Specular Samples, Applied Optics, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=841494 (Accessed December 17, 2024)