Bennett, H.
(2009),
Nanoscale Contacts Form the Bridge for Nano-Electrotechnical Businesses, NEMA ElectroIndustry Magazine, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=902771
(Accessed March 13, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Nanoscale Contacts Form the Bridge for Nano-Electrotechnical Businesses
Published
Author(s)
Abstract
The purpose of this paper is to suggest a possible framework for nanoscale contacts that the stakeholders in nano-electrotechnologies may follow to establish international standards with the goal of accelerating innovation in nano-electrotechnologies. Nanoscale contacts are expected to be challenges for many applications of nano-electrotechnologies. After defining nanotechnology and nano-electrotechnologies in the context of this paper, summary of likely business models and product opportunities for nano-electrotechnologies are given. The next section presents some generic questions and challenges about nanoscale contacts. The following section discusses five illustrative examples of metrology tools that require improved standards for assessing the performance and reliability of nanoscale contacts. And finally, the concluding section contains a few recommendations for action.Citation
NEMA ElectroIndustry Magazine
Volume
14
Issue
7
Pub Type
Others
Download Paper
Keywords
"Standards", "Measurements", "Nanoscale", "Electrical Contacts", and "Nano-Electrotechnologies"
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created August 3, 2009, Updated February 19, 2017