Yuan, L.
, Gao, L.
, Sabirianov, R.
, Liou, S.
, Chabot, M.
, Min, D.
, Moreland, J.
and Han, B.
(2006),
Microcantilever Torque Magnetometry Study of Patterned Magnetic Films, IEEE Transactions on Magnetics, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32266
(Accessed December 3, 2024)
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Microcantilever Torque Magnetometry Study of Patterned Magnetic Films
Published
Author(s)
L. Yuan, Lan Gao, R. Sabirianov, , Michelle Chabot, , , Bao Shan Han
Abstract
Microcantilever torque magnetometry (MTM) is a sensitive tool to measure small magnetization changes in the sample. In this paper, we investigated a process for preparing patterned magnetic films on cantilevers and studied the magnetic interactions of a single pair of micrometer-sized Ni80Fe20 bars (7 υm × 3.5 υm × 30 nm) separated by 50 nm using a MTM. The bars were prepared with focused ion beam milling. The magnetic hysteresis loops show that the switching field of a single bar is larger than the reversing field of only one of the paired bars and less than that of both paired bars. This clearly indicates that magnetostatic interaction exists between the close paired bars.Citation
IEEE Transactions on Magnetics
Volume
42
Issue
10
Pub Type
Journals
Download Paper
Keywords
cantilever, magnetic hysteresis loops, patterned films, torque magnetometry
Citation
Issues
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Created September 30, 2006, Updated October 12, 2021