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PUBLICATIONS

Nanomechanical Mapping with Resonance Tracking Scanned Probe Microscope

Published

Author(s)

Anthony B. Kos, Donna C. Hurley

Abstract

We present a new digital-signal-processor-based resonance tracking system for scanned probe microscopy (SPM) imaging. The system was developed to enable quantitative imaging of mechanical properties with nanoscale spatial resolution at practical data acquisition rates. It consists of a 32-bit floating-point digital signal processor connected to a high-resolution audio coder/decoder subsystem, an rms-to-dc converter, and a voltage-controlled oscillator. These components are used in conjunction with a commercial atomic force microscope to create a versatile platform for SPM mechanical mapping. Images of a glass-fiber/polymer matrix composite sample are presented to demonstrate system performance.
Citation
Review of Scientific Instruments
Volume
19
Pub Type
Journals

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Keywords

atomic force acoustic microscopy, atomic force microscope, contact-resonance spectroscopy, digital signal processor, elastic modulus, rms-to-dc converter, scanned probe microscopy
Electromagnetics

Citation

Kos, A. and Hurley, D. (2007), Nanomechanical Mapping with Resonance Tracking Scanned Probe Microscope, Review of Scientific Instruments, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32350 (Accessed October 28, 2025)

Issues

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Created November 22, 2007, Updated October 12, 2021
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