Micromechanical Instruments for Ferromagnetic Measurements

Published

January 1, 2003

Author(s)

John M. Moreland

Abstract

I review some of the novel methods for measuring ferromagnetic properties of thin films based on micromechanical magnetometers. Measurements rely on the detection of mechanical forces or torques on samples deposited onto microcantilevers. Displacements of the cantilever are detected by optical methods similar to those developed for atomic force microscopy. High sensitivities are achieved by integrating the sample with the detector, allowing magnetic measurements of samples with a total magnetic moment smaller than that detectable with conventional magnetometers. Cantilevers with low spring constants and high mechanical Q are essential for these measurements. Sensitivities better than 10⁵ υ_B are possible at room temperature with the potential for single spin detection below 1 K, where the thermomechanical noise of micromechanical sensors is substantially reduced.

Citation

Journal of Physics D-Applied Physics

Volume

36

Pub Type

Journals

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Keywords

atomic force microscope (AFM), calorimeter, ferromagnetic resonance FMR), gradient magnetometer, M-H loops, microelectromechanical systems MEMS), micromechanical detector, microwave instrumentation, torque magnetometer

Citation

Moreland, J. (2003), Micromechanical Instruments for Ferromagnetic Measurements, Journal of Physics D-Applied Physics, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30824 (Accessed November 21, 2024)