Ferromagnetic resonance linewidth in metallic thin films: Comparison of measurement methods

Published

May 22, 2006

Author(s)

Sangita S. Kalarickal, Pavol Krivosik, Mingzhong Wu, C E. Patton, Michael Schneider, Pavel Kabos, Thomas J. Silva, John P. Nibarger

Abstract

Strip line (SL), vector network analyzer (VNA), and pulsed inductive microwave magnetometer (PIMM) techniques were used to measure the ferromagnetic resonance (FMR) linewidth for a series of Permalloy films with thicknesses of 50 and 100 nm. The SL-FMR measurements were made for fixed frequencies from 1.5 to 5.5 GHz. The VNA-FMR and PIMM measurements were made for fixed in-plane fields from 1.6 to 8 kA/m (20-100 Oe). The results provide a confirmation, lacking until now, that the linewidths measured by these three methods are consistent and compatible. In the field format, the linewidths are a linear function of frequency, with a slope that corresponds to a nominal Landau-Lifshitz phenomenological damping parameter α value of 0.007 and zero frequency intercepts in the 160-320 A/m (2-4 Oe) range. In the frequency format, the corresponding linewidth versus frequency response shows a weak upward curvature at the lowest measurement frequencies and a leveling off at high frequencies.

Citation

Journal of Applied Physics

Volume

99

Issue

093909

Pub Type

Journals

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Keywords

damping, FMR, magnetodynamics, PIMM

Citation

Kalarickal, S. , Krivosik, P. , Wu, M. , Patton, C. , Schneider, M. , Kabos, P. , Silva, T. and Nibarger, J. (2006), Ferromagnetic resonance linewidth in metallic thin films: Comparison of measurement methods, Journal of Applied Physics, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32069 (Accessed December 26, 2024)