Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Frequency Tuning and Spurious Signal Generation at Microwave Frequencies in Ferroelectric Thin-film Transmission Lines

Published

Author(s)

Jordi Mateu, James Booth, S. A. Schima

Abstract

This work evaluates the RF tuning and the microwave nonlinear response of SrTiO3u thin-films by measuring the third harmonic and third order intermodulation proucts of several coplanar transmission lines. From these measurements, we obtain the distributed nonlinear capacitance per unit lenght as a function of RF bias voltage, C(Vrfu) using an accurate equivalent circuit to model the spurious signal generation. A unique value of C(Vrfu) is used to described the third harmonic generation, 3f1u and 3f2u, and the third order intermodulation products at 2f1+f2 and 2fd2+f1u frequencies, in a time scale range from hundreds of picoseconds to milliseconds. We compare C(Vdu) and obtain excellent agreement for 50K and 76K temperatures. From this result we interpret that equal tunability can be achieved from DC to nanosecond time scales, and that some of the spurious signals generated in STO ferroelectric transmission lines can be predicted directly from bias measurements.
Volume
55
Issue
2
Conference Dates
June 11-16, 2006
Conference Location
San Francisco, CA, USA
Conference Title
IEEE MTT-S International Microwave Symposium

Keywords

ferroelectric transmission lines, Rf tuning, thin films

Citation

Mateu, J. , Booth, J. and Schima, S. (2007), Frequency Tuning and Spurious Signal Generation at Microwave Frequencies in Ferroelectric Thin-film Transmission Lines, IEEE MTT-S International Microwave Symposium, San Francisco, CA, USA (Accessed July 17, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created February 13, 2007, Updated October 12, 2021