Workshop on Texture in Electronic Applications

Published

May 1, 2001

Author(s)

Mark D. Vaudin, Debra L. Kaiser

Abstract

A two day workshop on Texture in Electronic Applications was held on October 10-11,2000 at NIST, Gaithersburg. The workshop presented an excellent forum for discussion of a broad spectrum of texture-related issues of interest to academic,government and industrial participants The need for a thin film texture standard was expressed and an informal round robin corrdinated by NIST will be started this year as a first step in the standards development process. In addition, NIST will evaluate the broader need for a Guide to Practice on texture measurement by conventional diffractometers. The group decided to hold a symposium on Texture and Microstructure in Electronic and Magnetic Films for the Materials Research Society Spring 2002 meeting.

Citation

Journal of Research (NIST JRES) -

Volume

106 No. 3

NIST Pub Series

Journal of Research (NIST JRES)

Pub Type

NIST Pubs

Keywords

crystallographic texture, electronic applications, presentations, round table discussion, workshop

Citation

Vaudin, M. and Kaiser, D. (2001), Workshop on Texture in Electronic Applications, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD (Accessed March 12, 2025)