Unguris, J.
, Scheinfein, M.
, Celotta, R.
and Pierce, D.
(1989),
Scanning Electron Microscopy with Polarization Analysis Studies of Ni-Fe Magnetic Memory Elements, IEEE Transactions on Magnetics
(Accessed January 13, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Scanning Electron Microscopy with Polarization Analysis Studies of Ni-Fe Magnetic Memory Elements
Published
Author(s)
, , ,
Abstract
This paper describes the use of Scanning Electron Microscopy with Polarization Analysis to quantitatively image the magnetic structure of permalloy magnetic memory elements. Various methods of determining the absolute magnitude and direction of the magnetization vector are described. The magnetic domain structures are observed as a function of ion milling time. During ion milling the surface composition is monitored by Auger analysis.Citation
IEEE Transactions on Magnetics
Volume
25
Issue
5
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 31, 1988, Updated October 12, 2021