Saito, T.
, Hughey, L.
, Proctor, J.
and O'Brian, T.
(1996),
Polarization Characteristics of Silicon Photodiodes and Its Dependence on Oxide Thickness in the Far UV Region, Review of Scientific Instruments
(Accessed December 30, 2024)
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Polarization Characteristics of Silicon Photodiodes and Its Dependence on Oxide Thickness in the Far UV Region
Published
Author(s)
T Saito, , ,
Citation
Review of Scientific Instruments
Volume
A10
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 31, 1995, Updated October 12, 2021