Heigel, J.
, Ivester, R.
and Whitenton, E.
(2008),
Cutting Temperature Measurements of Segmented Chips using Dual-Spectrum High-Speed Microvideography, Transactional Analysis Journal, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=823005
(Accessed December 17, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Cutting Temperature Measurements of Segmented Chips using Dual-Spectrum High-Speed Microvideography
Published
Author(s)
, ,
Abstract
Dual-Spectrum high speed microvideography involves the use of synchronized high speed visible light (30,000 frames/s) and infrared (600 frames/s) cameras. This paper presents analysis method and results of such a system to determine chip temperatures during during orthogonal cutting of American Iron and Steel Institute 1045 steel with coated carbide tool. Speeds from 200-600 m/min at a feeds of 0.15 mm/rev and 0.30 mm/rev represent industrially relevant cutting conditions. Obtaining temperature measurements on precise points of the chip by using the visible light images to navigate the infrared images proves to be advantageous.Citation
Transactional Analysis Journal
Report Number
823005
Volume
36
Pub Type
Journals
Download Paper
Keywords
Temperature measurement, carbide tooling, turning, dual spectrum, microvideography
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created May 20, 2008, Updated January 27, 2020