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PUBLICATIONS

Cryogenic Microcalorimeters for X-Ray Microanalysis

Published

Author(s)

David A. Wollman, Gene C. Hilton, Kent D. Irwin, Norman F. Bergren, David A. Rudman, Dale Newbury, John M. Martinis
Proceedings Title
Proc., 1999 National Conference of Standards Laboratories Workshop and Symposium (NCSL)
Conference Dates
July 11-15, 2099
Conference Location
Charlotte, NC, USA
Pub Type
Conferences

Download Paper

Local Download
Sensors

Citation

Wollman, D. , Hilton, G. , Irwin, K. , Bergren, N. , Rudman, D. , Newbury, D. and Martinis, J. (1999), Cryogenic Microcalorimeters for X-Ray Microanalysis, Proc., 1999 National Conference of Standards Laboratories Workshop and Symposium (NCSL), Charlotte, NC, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=3669 (Accessed January 3, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created June 30, 1999, Updated October 12, 2021