Moreland, J.
, Harvey, T.
, Ono, R.
and Roshko, A.
(1993),
Scanned Probe Microscopy of YBa<sub>2</sub>Cu<sub>3</sub>O<sub>x</sub> Thin-Film Device Structures on Si Substrates, IEEE Transactions on Applied Superconductivity
(Accessed July 18, 2024)
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Scanned Probe Microscopy of YBa2Cu3Ox Thin-Film Device Structures on Si Substrates
Published
Author(s)
, , ,
Citation
IEEE Transactions on Applied Superconductivity
Volume
3(1)
Pub Type
Journals
Citation
Issues
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Created February 28, 1993, Updated October 12, 2021