Jeanneret, B.
, Rufenacht, A.
and Burroughs, C.
(2000),
Comparison Between the SNS and SIS Josephson Voltage Standards at NIST, Proc., Conference on Precision Electromagnetic Measurements (CPEM), Sydney, 1, AS
(Accessed July 18, 2024)
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Comparison Between the SNS and SIS Josephson Voltage Standards at NIST
Published
Author(s)
Blaise Jeanneret, Alain Rufenacht,
Proceedings Title
Proc., Conference on Precision Electromagnetic Measurements (CPEM)
Issue
22
Conference Dates
May 14-19, 2000
Conference Location
Sydney, 1, AS
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created April 30, 2000, Updated October 12, 2021