Dielectric Sleeve Resonator Techniques for Variable-Temperature Microwave Characterization of Ferroelectric Materials

Published

June 7, 2002

Author(s)

Richard G. Geyer, Pavel Kabos, James R. Baker-Jarvis

Abstract

Low loss sleeve resonators can be used for accurate microwave dielectric characterization of rod-shaped test specimens. The test specimen is inserted into the dielectric sleeve resonator and placed centrally in a metal cavity. With the use of additional sleeve resonators having differing external diameters of permittivities, a single specimen can be characterized at multiple frequencies. Sleeve resonators can also be employed for accurate dielectric charaterization of high-permittivity speciments having dielectric loss fatcors greater than 0.001. Closed-form solutions for TE_omp resonant mode structure are given. Uncertainty relations for permittivity and dielectric loss are also shown, which demonstrate that when samlpe electric energy filling factors are greater than 0.4, relative uncertainties in measured permittivity and dielectric loss tangent are less than 1% and 4%, even for relative permittivities greater than 600. Example measurements are given that illustrate how this dielectric resonator system can be employed for dielectric characterization of ferroelectric materials at temperatures both near or far from their Curie temperatures.

Conference Dates

June 2-7, 2002

Conference Location

Seattle, WA, USA

Conference Title

2002 IEEE MTT-S International Microwave Symposium

Pub Type

Conferences

Keywords

ferroelectric, permittivity, reentrant cavity, tenability, transfer chain matrix

Citation

Geyer, R. , Kabos, P. and Baker-Jarvis, J. (2002), Dielectric Sleeve Resonator Techniques for Variable-Temperature Microwave Characterization of Ferroelectric Materials, 2002 IEEE MTT-S International Microwave Symposium, Seattle, WA, USA (Accessed July 18, 2024)