Kim, Y.
and Rudd, M.
(1997),
Electron-Impact Total Ionization Cross Sections of CH AND C<sub>2</sub>H<sub>2</sub>, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed July 19, 2024)
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Electron-Impact Total Ionization Cross Sections of CH AND C2H2
Published
Author(s)
Y -. Kim, M E. Rudd
Citation
Journal of Research (NIST JRES) -
Volume
102
Issue
6
NIST Pub Series
Pub Type
NIST Pubs
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 1997, Updated February 17, 2017