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PUBLICATIONS

Extended Abstract: Interfacial Scattering of Hot Electrons in Ultra-Thin Magnetic Films

Published

Author(s)

R P. Lu, B A. Morgan, K L. Kavanagh, Cedric J. Powell, P J. Chen, F Serpa, William F. Egelhoff Jr.

Abstract

In the emerging field of Spintronics the transport of hot electrons through magnetic thin films seems destined to play a key role. To help understand such transport, we have used ballistic electron emission microscopy (BEEM) to measure hot-electron transport across magnetic-metal multilayer/semiconductor structures.
Citation
Conference on the Physics and Chemistry of Semiconductor Interfaces
Pub Type
Journals

Keywords

ballistic electron emission microscopy (, hot electrons, spintronics, ultra-thin magnetic films

Citation

Lu, R. , Morgan, B. , Kavanagh, K. , Powell, C. , Chen, P. , Serpa, F. and Egelhoff Jr., W. (2021), Extended Abstract: Interfacial Scattering of Hot Electrons in Ultra-Thin Magnetic Films, Conference on the Physics and Chemistry of Semiconductor Interfaces (Accessed July 18, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created October 12, 2021