Delos-Reyes, M.
, Kassner, M.
and Levine, L.
(2021),
X-Ray Diffraciton and the Existence of Long Range Internal Stresses, International Symposium on Plasticity and Its Current Applications
(Accessed March 13, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
X-Ray Diffraciton and the Existence of Long Range Internal Stresses
Published
Author(s)
M A. Delos-Reyes, M E. Kassner,
Abstract
Long range internal stresses (LRIS) are often used to explain various aspects of the mechanical behavior of materials. Recent experiments by the authors indicate an absence of measurable LRIS. X-ray line asymmetry, however, has long been interpreted as an argument in favor of the existence of LRIS. The literature in this area are reanalyzed and new computer simulations of diffraction peaks in dislocated crystals are discussed. It was found that there is more than one explanation for x-ray line asymmetry, and that LRIS is not required.Citation
International Symposium on Plasticity and Its Current Applications
Pub Type
Journals
Keywords
dislocations, internal stresses, x-ray diffraction
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created October 12, 2021