Germer, T.
and Asmail, C.
(1999),
Goniometric Optical Scatter Instrument for Out-of-Plane Ellipsometry Measurements, Review of Scientific Instruments
(Accessed July 18, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Goniometric Optical Scatter Instrument for Out-of-Plane Ellipsometry Measurements
Published
Author(s)
,
Abstract
A goniometric optical scatter instrument has been developed at the National Institute of Standards and Technology which can readily perform measurements of optical scatter and its associated polarization in directions out of the plane of incidence. In this article the coordinate transformations that are required to operate such a goniometer with respect to sample-specific coordinates are described. We present new methods for measuring the 3 x 3 nonhanded Mueller matrix elements using dual rotating half-wave retarders, and present a subset of the Mueller matrix, referred to as the bidirectional ellipsometric parameters which have been shown to simplify the interpretation of the data. The results of out-of-plane Meuller matrix and bidirectional ellipsometric measurements from a titanium nitride layer on silicon are presented.Citation
Review of Scientific Instruments
Volume
70
Issue
No. 9
Pub Type
Journals
Keywords
brdf, ellipsometry, goniometer, optical scatter, polarimetry, reflectance
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created June 1, 1999, Updated February 17, 2017