Takacs, E.
and Gillaspy, J.
(2002),
Trapped Highly Charged Ion Plasmas, Non-Neutral Plasma Physics
(Accessed December 21, 2024)
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Trapped Highly Charged Ion Plasmas
Published
Author(s)
E Takacs,
Abstract
Electron beam Ion Trap (EBIT) devices are reviewed with special attention to applications in highly charged ion plasma research. EBIT properties are presented based on information extracted from a variety of experiments presented in the literature. Topics discussed include typical Debye length, Wigner-Seitz radius, Coulomb coupling parameter, Brillouin radius, magnetic trapping mode, ion cloud shape, density, temperature, rotation, and evaporative cooling. We conclude that the quantitative understanding of highly charged ion plasmas inside an EBIT requires improved modeling and advanced diagnostic techniques.Citation
Non-Neutral Plasma Physics
Pub Type
Journals
Keywords
density diagnostics, electron beam ion trap, evaporative cooling, highly charged ions, ion cloud imaging, magnetic trapping, non-neutral plasmas, temperature diagnostics
Citation
Issues
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Created December 31, 2001, Updated October 12, 2021