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PUBLICATIONS

Characterization of the ZnSe/GaAs Interface by TEM and Spectroscopic Ellipsometry

Published

Author(s)

R. Dahmani, Lourdes Salamanca-Riba, Nhan Van Nguyen, Deane Chandler-Horowitz, B T. Jonker
Proceedings Title
Proc., Materials Research Society Symposium
Volume
280
Conference Location
Boston, MA, USA
Pub Type
Conferences

Citation

Dahmani, R. , Salamanca-Riba, L. , Nguyen, N. , Chandler-Horowitz, D. and Jonker, B. (1993), Characterization of the ZnSe/GaAs Interface by TEM and Spectroscopic Ellipsometry, Proc., Materials Research Society Symposium, Boston, MA, USA (Accessed January 3, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 30, 1993, Updated October 12, 2021