NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Frequency and duration of communication system outages resulting from polarization mode dispersion
Published
Author(s)
D. Yevick, M. Reimer, H. Yaffe, Paul Leo, D Peterson, S.C. T. Wang, Kent B. Rochford
Abstract
In this paper, we employ measurements of transponder tolerance to both differential group delay (DGD) and second-order polarization mode dispersion (SOPMD) and of the temporal evolution of DGD and SOPMD in installed transmission systems to predict the influence of PMD on the rate and duration of PMD-induced system outages. An empirical 2-D random-walk model predicts that the outage rate and duration depends solely on the mean fiber DGD. We find that the step size of the random walk is nearly uncorrelated with the instantaneous value of the PMD. We then justify the assumptions of this procedure with a full numerical simulation and employ a biased Markov chain algorithm to generate highly accurate results for system outages where simplified models fail.
optical fiber applications, optical fiber polarization, numerical analysis, Monte Carlo methods
Citation
Yevick, D.
, Reimer, M.
, Yaffe, H.
, Leo, P.
, Peterson, D.
, Wang, S.
and Rochford, K.
(2008),
Frequency and duration of communication system outages resulting from polarization mode dispersion, Journal of Lightwave Technology, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31752
(Accessed October 11, 2025)