Efficient Dithering Technique with Periodic Waveforms for RF Test and Characterization

Published

October 7, 2013

Author(s)

Catherine A. Remley, Saeed Farsi, Bart Nauwelaers, Dominique Schreurs

Abstract

A dithering technique based on ensemble averaging of waveforms is proposed. In the proposed method, instead of performing several measurements with different dithering additive noise, a single measurement of multiple periods of a sine-dithered periodic waveform is used. The measured waveform is then segmented and the segments are averaged to obtain a noise-reduced post-processed waveform. This technique provides improved efficiency in test and characterization applications where accuracy higher than that of the built-in data converters of the measurement equipment is required. Moreover, it is shown that by using large dithering signals in the proposed technique, one can reduce the non-ideal effects in real applications. The measured reduction in the adjacent channel power of a modulated signal emanating from an arbitrary waveform generator supports the effectiveness of the approach.

Citation

IEEE Transactions on Microwave Theory and Techniques

Volume

61

Issue

11

Pub Type

Journals

Download Paper

https://doi.org/10.1109/TMTT.2013.2283847

Keywords

Analog-to-digital converter (ADC), digital-to-analog converter (DAC), dithering, ensemble averaging, modulated-signal measurement, quantization noise, wireless system test.

Citation

Remley, C. , Farsi, S. , Nauwelaers, B. and Schreurs, D. (2013), Efficient Dithering Technique with Periodic Waveforms for RF Test and Characterization, IEEE Transactions on Microwave Theory and Techniques, [online], https://doi.org/10.1109/TMTT.2013.2283847 (Accessed July 18, 2024)