Lowell, P.
, O'Neil, G.
, Underwood, J.
and Ullom, J.
(2011),
Andreev Reflections in Micrometer-Scale Normal Metal-Insulator-Superconductor Tunnel Junctions, Journal of Low Temperature Physics, [online], https://doi.org/10.1007/s10909-011-0425-2
(Accessed December 21, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Andreev Reflections in Micrometer-Scale Normal Metal-Insulator-Superconductor Tunnel Junctions
Published
Author(s)
, , ,
Abstract
Understanding the subgap behavior of Normal-Insulator-Superconductor (NIS) tunnel junctions is important in order to be able to accurately model the thermal properties of the junctions. Hekking and Nazarov developed a theory in which the NIS sub gap current can be modeled by multiple Andreev reflections. In their theory, the current caused by Andreev reflections depends on the junction area and junction resistance area product. We have measured the Andreev current in Normal-Insulator-Superconductor (NIS) tunnel junctions for various junction sizes and junction resistance area products and found that Hekking and Nazarov's theory is in agreement with our data.Citation
Journal of Low Temperature Physics
Volume
167
Issue
3
Pub Type
Journals
Download Paper
Keywords
Andreev Reflection, Subgap Conductance, Superconducting Tunnel Junctions
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created November 24, 2011, Updated November 10, 2018