Christie Trimble is a physicist in the Microsystems and Nanotechnology Division at NIST, where she advances the development of microscopy calibration standards through nanofabrication and measurement. She received a B.S. in Physics from Arizona State University and a Ph.D. in Physics from the University of Maryland, College Park, where she was a graduate fellow of the Joint Quantum Institute. Her doctoral work focused on the experimental study of topological Josephson devices. Before joining NIST, she specialized in fabricating superconducting thin films and devices in private industry.