Craig Copeland is a Research Scientist in the Microsystems & Nanotechnology Division. He received a B.S. in Physics from the University of Maryland, Baltimore County and an M.A. and Ph.D. in Physics from The Johns Hopkins University. At Johns Hopkins, he developed devices and methods for applying and measuring forces in single-cell systems. His current research focuses on the design and characterization of reference materials and calibration methods for localization microscopy, and developing measurement methods for microelectromechanical systems, nanofabrication processes, nanoparticle characterization, and cancer diagnostics.