Ms. Benham serves as the nation's leading advocate for the voluntary adoption of the International System of Units (SI), commonly referred to as the metric system. In her role as NIST Metric Program Leader, she offers invaluable guidance and support to federal, state, and local weights and measures officials, businesses, educational institutions, educators, and the public. She is focused on fostering a deeper understanding and wider adoption of the SI measurement system in trade, commerce, and daily life. The NIST Metric Program is the cornerstone of the national policy to establish the SI as the preferred system of weights and measures for U.S. trade and commerce. Ms. Benham underscores the SI's importance for U.S. industry's competitiveness in the global marketplace by championing its integration into product design, manufacturing, labeling, and marketing.
Under her direction, the NIST Metric Program offers a series SI focused professional development and training courses. Ms. Benham is deeply committed to advancing Science, Technology, Engineering, and Mathematics (STEM) education and outreach. She actively collaborates with K-12 educators, helping them seamlessly integrate metric system and measurement science principles into their curricula, and enriching the learning experience for all learners. Ms. Benham is dedicated to elevating professional standards in metrology through the analysis of training needs, designing, and developing tailored training to ensure the ongoing impact and effectiveness of OWM program area. To enhance your skills and knowledge, stay up-to-date with the OWM learning events schedule.
Ms. Benham plays a pivotal role in several crucial programs and projects:
For inquiries or more information, reach Ms. Benham at TheSI [at] nist.gov (TheSI[at]nist[dot]gov).
ORCID: 0000-0002-2751-7881