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Gheorghe Stan (Fed)
Physicist
Research Interests
- Develop and customize instrumentation for Atomic Force Microscopy (AFM) to enable advanced and reliable nanoscale property characterization, with direct applications in nanoelectronics, micro- and nano-electromechanical systems, thin film coatings, additive manufacturing, and biotechnology.
- Use AFM-based characterization techniques to investigate nanoscale structure-property relationship in fabricated structures and devices.
- Develop Contact Resonance AFM (CR-AFM) for nanoscale elastic modulus measurements. Extend CR-AFM to Intermittent Contact Resonance AFM (ICR-AFM) for subsurface and 3D mechanical property measurements.
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Established collaborative work between NIST, academia, industry, and instrument vendors to promote the development of nanoscale characterization techniques for new materials and devices.
Ongoing Projects
- Nanoscale Property Measurements by Atomic Force Microscopy
- Scanning Probe Microscopy Measurements and Standards
Patents
- US Patent # 9,535,085 "Intermittent Contact Resonance Atomic Force Microscopy and Process for Intermittent Contact Resonance Atomic Force Microscopy," Inventors: Stan & Gates (2017)
Citations
Awards
2009 MSEL Distinguished Associate Award
2021 DOC Bronze Medal “For the invention, development, and industrial application of Intermittent Contact Resonance Atomic Force Microscopy”