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Jason Ryan (Fed)
Dr. Ryan is a research staff member and leads an effort in magnetic resonance spectroscopy in the Advanced Electronics Group in the Nanoscale Device Characterization Division of the Physical Measurement Laboratory (PML). He received the B.S. degree in Physics from Millersville University, Millersville, PA in 2004. He received the M.S. degree in Engineering Science and a Ph.D. in Materials Science and Engineering from The Pennsylvania State University, University Park, PA in 2006 and 2010, respectively. In 2010, he was awarded a National Research Council (NRC) post-doctoral fellowship which he spent at NIST where he is still currently employed. He has contributed to more than 80 peer reviewed technical publications and over 125 presentations at international conferences. Dr. Ryan also holds 3 patents. He has been heavily involved in the technical and managerial committees of both the IEEE International Reliability Physics Symposium and IEEE International Integrated Reliability Workshop conferences, having served as General Chair of the latter in 2015. His research interests involve utilizing magnetic resonance spectroscopy to understand the physics and kinetics of atomic-scale defects responsible for critical failure and drift mechanisms in advanced electronic devices and materials.
Programs and Research Efforts
Selected Publications
- S. J. Moxim, N. J. Harmon, K. J. Myers, J. P. Ashton, E. B. Frantz, M. E. Flatté, P. M. Lenahan, and J. T. Ryan, “Tunable zero-field magnetoresistance responses in Si transistors: Origins and applications” J. Appl. Phys. 135, 155703 (2024). https://doi.org/10.1063/5.0203331
- S. J. Moxim, J. P. Ashton, M. A. Anders, and J. T. Ryan, “Combining electrically detected magnetic resonance techniques to study atomic-scale defects generated by hot-carrier stressing in HfO2/SiO2/Si transistors” J. Appl. Phys. 133, 145702 (2023). https://doi.org/10.1063/5.0145937
- K. J. Myers, P. M. Lenahan, J. P. Ashton, and J. T. Ryan, “A new approach to electrically detected magnetic resonance: Spin-dependent transient spectroscopy” J. Appl. Phys. 132, 115301 (2022). https://doi.org/10.1063/5.0101852
- J. P. Ashton, M. A. Anders and J. T. Ryan, “Detection of individual spin species via frequency-modulated charge pumping” Appl. Phys. Lett. 120, 053504 (2022). https://doi.org/10.1063/5.0081172
- D. J. McCrory, M. A. Anders, J. T. Ryan, P. R. Shrestha, K. P. Cheung, P. M. Lenahan, and J. P. Campbell, “Wafer-Level Electrically Detected Magnetic Resonance: Magnetic Resonance in a Probing Station” IEEE Trans Device and Mater Reliab. 18, 139–143 (2018). https://doi.org/10.1109/TDMR.2018.2817341
