Jeremy Schultz (Fed)

Jeremy Schultz is a Physical Scientist in the International and Academic Affairs Office (IAAO) at the National Institute of Standards and Technology (NIST) in Gaithersburg, MD. In this role he provides technical expertise and assistance in the areas of safeguarding international science and engagement in support of the CHIPS and Science Act. He serves as a liaison for IAAO, supporting both the CHIPS R&D and Incentives Offices and the NIST Research Security Office.

He was previously an NRC Postdoctoral Fellow in the Nanoscale Device Characterization Division at NIST, where he worked to develop atomic-scale resolution spectroscopy to characterize defects and impurities of new materials (2D, quantum, wide bandgap) and devices. This method can be used to probe fundamental light-matter and electron-correlation effects at length scales relevant to emerging nanoelectronics and quantum devices (typically, 1 nm to 1000 nm).

He received his Ph.D. in Chemistry in 2021 from the University of Illinois Chicago where he worked to develop and apply a tandem technique that uses fundamental light-matter interactions to probe and excite materials and chemistry with atomic-scale resolution. He also holds a bachelor’s degree in chemistry with a concentration in materials and nanotechnology and a minor in English literature from Northwestern University.

Early Career Professional Contributing to the Advancement of Thin Films, Surfaces, Interfaces, and Plasmas – Journal of Vacuum Science & Technology A - 2022

Emerging Leader – Journal of Physics: Condensed Matter – 2021

Barbara Stull Graduate Student Award – Society for Applied Spectroscopy – 2021

Wayne B. Nottingham Prize – 81^st Physical Electronics Conference – 2021