Monica D. Edelstein

Publications

Methods to Characterize the Electrical and Mechanical Properties of Si Nanowires

September 30, 2007

Author(s)

Qiliang Li, Sang-Mo Koo, Hao Xiong, Monica D. Edelstein, John S. Suehle, Xiaoxiao Zhu, D. E. Ioannou, Curt A. Richter

We report metrology methods to characterize nanowires. In this work, representative devices and test structures, including nanoelectromechanical switches, non

Silicon Nanowire Electromechanical Switches for Logic Device Application

July 6, 2007

Author(s)

Qiliang Li, Sang-Mo Koo, Monica D. Edelstein, John S. Suehle, Curt A. Richter

Electromechanical switches consisting of chemical-vapor-deposition grown silicon nanowires suspended over metal electrodes have been fabricated successfully by

Precise Manipulation and Alignment of Single Nanowire

March 2, 2007

Author(s)

Qiliang Li, Sang-Mo Koo, Curt A. Richter, Monica D. Edelstein, John E. Bonevich, Joseph Kopanski, John S. Suehle, Eric M. Vogel

Nanowires and nanotubes are being intensively investigated for nanoelectronic transport applications. The integration of such nanostructures into circuitry

Precise Alignment of single Nanowires and Fabrication of Nanoelectromechanical Switch and Other Test Structures

March 1, 2007

Author(s)

Qiliang Li, Sang-Mo Koo, Curt A. Richter, Monica D. Edelstein, John E. Bonevich, Joseph Kopanski, John S. Suehle, Eric M. Vogel

The integration of nanowires and nanotubes into electrical test structures to investigate their nanoelectronic transport properties is a significant challenge

Low-Frequency Noise Characterizations of ZnO Nanowires Field Effect Transistors

February 28, 2007

Author(s)

Wenyong Wang, Hao Xiong, Monica D. Edelstein, David J. Gundlach, John S. Suehle, Curt A. Richter, Woong-Ki Hong, Takhee Lee

Field effect transistors (FETs) of single-crystalline ZnO nanowires have been fabricated and low frequency (f) noise characterizations of the ZnO nanowire FETs

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Monica D. Edelstein (Fed)

Publications